Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-12-20
2011-12-13
Richards, N Drew (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S001000, C257S002000, C257S004000, C257S005000, C365S148000
Reexamination Certificate
active
08076664
ABSTRACT:
A phase change memory may be formed with an insulator made up of two different layers having significantly different thermal conductivities. Pores may be formed within the stack of insulating layers and the pores may be filled with heaters, chalcogenide layers, and electrodes in some embodiments. The use of the two different insulator layers enables embodiments where thermal losses may be reduced and an amorphous region may be maintained along the entire length of the phase change material layer.
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Karpov Ilya V.
Kencke David L.
Savransky Semyon D.
Intel Corporation
Jung Michael
Richards N Drew
Trop Pruner & Hu P.C.
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