Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-04-26
2011-04-26
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE45002
Reexamination Certificate
active
07932509
ABSTRACT:
A phase change memory device is disclosed, including a substrate. The phase change memory also includes a bottom electrode. A conductive structure with a cavity is provided to electrically contact the bottom electrode, wherein the conductive structure includes sidewalls with different thicknesses. A phase change spacer is formed to cross the sidewalls with different thicknesses. A top electrode is electrically contacted to the phase change spacer.
REFERENCES:
patent: 6927410 (2005-08-01), Chen
patent: 7576350 (2009-08-01), Lowrey et al.
patent: 7696077 (2010-04-01), Liu
patent: 7732801 (2010-06-01), Chen
patent: 7834341 (2010-11-01), Wu et al.
patent: 2006/0077706 (2006-04-01), Li et al.
patent: 2006/0113520 (2006-06-01), Yamamoto et al.
patent: 2007/0158698 (2007-07-01), Dennison et al.
patent: 1992326 (2007-07-01), None
Chen Chih-Wei
Chen Frederick T
Chen Wei-Su
Budd Paul A
Industrial Technology Research Institute
Jackson, Jr. Jerome
LandOfFree
Phase change memory element does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase change memory element, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase change memory element will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2717615