Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-12-08
2010-12-28
Prenty, Mark (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE45002
Reexamination Certificate
active
07858960
ABSTRACT:
A phase change memory device includes a semiconductor substrate having an impurity region and an interlayer dielectric applying a tensile stress formed on the semiconductor substrate and having contact holes exposing the impurity region. Switching elements are formed in the contact holes; and sidewall spacers interposed between the switching elements and the interlayer dielectric and formed as a dielectric layer applying a compressive stress.
REFERENCES:
patent: 6121164 (2000-09-01), Yieh et al.
patent: 7651906 (2010-01-01), Park et al.
patent: 1020080078972 (2008-08-01), None
Hynix / Semiconductor Inc.
Ladas & Parry LLP
Prenty Mark
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