Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-12-30
2011-11-15
Tran, Tan N (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S910000, C257SE47001, C365S163000
Reexamination Certificate
active
08058637
ABSTRACT:
A phase change memory device includes a semiconductor substrate having a first conductivity type well An isolation structure is formed in the semiconductor substrate having the first conductivity type well to define active regions. Second conductivity type high concentration areas are formed in surfaces of the active regions. Insulation patterns are formed under the second conductivity type high concentration areas to insulate the second conductivity type high concentration areas from the first conductivity type well. A plurality of vertical diodes are formed on the second conductivity type high concentration areas which are insulated from the first conductivity type well.
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patent: 2007/0173010 (2007-07-01), Lee et al.
patent: 2009/0161406 (2009-06-01), Chuang et al.
patent: 1020060094424 (2006-08-01), None
patent: 1020090088009 (2009-08-01), None
Hynix / Semiconductor Inc.
Ladas & Parry LLP
Tran Tan N
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