Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-12-04
2011-12-06
Louie, Wai Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S002000, C257S003000
Reexamination Certificate
active
08071970
ABSTRACT:
A phase change memory device comprising an electrode, a phase change layer crossing and contacting the electrode at a cross region thereof, and a transistor comprising a source and a drain, wherein the drain of the transistor electrically connects the electrode or the phase change layer is disclosed.
REFERENCES:
patent: 3820150 (1974-06-01), Nicolaides
patent: 4946501 (1990-08-01), Nate et al.
patent: 6813031 (2004-11-01), Poris et al.
patent: 7829876 (2010-11-01), Lung
patent: 2006/0011902 (2006-01-01), Song et al.
patent: 2006/0046509 (2006-03-01), Gwan-Hyeob
patent: 2006/0113573 (2006-06-01), Cheong et al.
patent: 2006/0223268 (2006-10-01), Moriya et al.
patent: 2006/0226409 (2006-10-01), Burr et al.
patent: 2007/0034905 (2007-02-01), Elkins
patent: 2007/0154847 (2007-07-01), Chen et al.
patent: 2007/0215852 (2007-09-01), Lung
A. L. Lacaita et al, “Electrothermal and phase-change dynamics in chalcogenide-based memories”, IEEE, 2004, USA.
S.L. Cho et al, Highly Scalable On-axis Confined Cell Structure for High Density PRAM beyond 256Mb, 2005, Symposium on VLSI Digest of Technical Papers, pp. 96-97.
Jonathan D. Maimon et al, “Chalcogenide Memory Arrays: Characterization and Radiation Effects”, Dec. 2003, pp. 1878-1884. vol. 50, No. 6, IEEE Transactions on Nuclear Science, USA.
Jahan Bilkis
Louie Wai Sing
ProMOS Technologies Inc.
Winbond Electronics Corp.
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