Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2006-02-28
2006-02-28
Picardat, Kevin M. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S577000, C257S588000, C438S005000, C438S102000
Reexamination Certificate
active
07005665
ABSTRACT:
The present invention includes a method for forming a phase change material memory device and the phase change memory device produced therefrom. Specifically, the phase change memory device includes a semiconductor structure including a substrate having a first doped region flanked by a set of second doped regions; a phase change material positioned on the first doped region; and a conductor positioned on the phase change material, wherein when the phase change material is a first phase the semiconductor structure operates as a bipolar junction transistor, and when the phase change material is a second phase the semiconductor structure operates as a field effect transistor.
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Furkay Stephen S.
Hamann Hendrick
Johnson Jeffrey B.
Lam Chung H.
Wong Hon-Sum P.
Canale Anthony
Picardat Kevin M.
Scully Scott Murphy & Presser
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