Phase change memory cell including nanocomposite insulator

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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C257S314000, C257S004000, C257SE21003, C977S723000, C977S720000, C977S785000, C977S831000

Reexamination Certificate

active

07453081

ABSTRACT:
A memory cell includes a first electrode, a second electrode, storage material positioned between the first electrode and the second electrode, and a nanocomposite insulator contacting the storage material.

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patent: 10 2004 014 487 (2005-11-01), None
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Hwang et al., “Full Integration and Reliability Evaluation of Phase-change RAM”, Symposium on VLSI Teachnology Digest of Technical Papers, 2 pgs. (2003).
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Lai et al., “Current Status of the phase change memory and its future”, IEDM, 4 pgs (2003).
Pellizzer et al., Novel Trench Phase-Change Memory Cell for Embedded and Stand-Alone Non-Volatile Memory Applications, VLSI, 2 pgs. (2004).
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