Phase change memory and method therefor

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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Details

C257S003000, C257S004000, C257S005000, C257S007000, C257S296000

Reexamination Certificate

active

10318984

ABSTRACT:
Briefly, in accordance with an embodiment of the invention, a phase change memory and a method to manufacture a phase change memory is provided. The phase change memory may include a memory material and a first tapered contact adjacent to the memory material. The phase change memory may further include a second tapered contact separated from the first tapered contact and adjacent to the memory material, wherein the first and second tapered contacts are adapted to provide a signal to the memory material.

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patent: 5177567 (1993-01-01), Klersy et al.
patent: 5534711 (1996-07-01), Ovshinsky et al.
patent: 5687112 (1997-11-01), Ovshinsky
patent: 5789277 (1998-08-01), Zahorik et al.
patent: 6015977 (2000-01-01), Zahorik
patent: 2003/0001230 (2003-01-01), Lowrey
patent: 2003/0183867 (2003-10-01), Fricke et al.

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