Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2009-02-03
2011-11-22
Nhu, David (Department: 2895)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S238000, C438S381000, C257SE21006, C257SE21253, C257SE21316, C257SE21645, C257SE21646
Reexamination Certificate
active
08062921
ABSTRACT:
A phase change memory may be made with improved speed and stable characteristics over extended cycling. The alloy may be selected by looking at alloys that become stuck in either the set or the reset state and finding a median or intermediate composition that achieves better cycling performance. Such alloys may also experience faster programming and may have set and reset programming speeds that are substantially similar.
REFERENCES:
patent: 5166758 (1992-11-01), Ovshinsky et al.
patent: 5341328 (1994-08-01), Ovshinsky et al.
patent: 5414271 (1995-05-01), Ovshinsky et al.
patent: 5534711 (1996-07-01), Ovshinsky et al.
patent: 6819469 (2004-11-01), Koba
patent: 7504675 (2009-03-01), Wicker et al.
Hudgens Stephen J.
Kostylev Sergey A.
Schell Carl
Wicker Guy C.
Intel Corporation
Nhu David
Trop Pruner & Hu P.C.
LandOfFree
Phase change memories with improved programming characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase change memories with improved programming characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase change memories with improved programming characteristics will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4305868