Peripherally leaded package test contactor

Details Peripherally leaded package test contactor Peripherally leaded package test contactor

1997-03-11

2000-05-16

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, 324758, G01R 1073

Patent

active

060642181

ABSTRACT:
A contactor receives an electrical component having peripheral leads. The contactor guides the peripherally leaded component into contact with automated testing equipment. Electrical connections are made with the peripheral leads of the electrical component. The contactor includes a number of cantilever spring contacts for contacting the peripheral leads on the component in the peripherally leaded package. Each cantilever spring contact has a first free end which is upturned and contacts the peripheral lead. The cantilever spring contact has a second attached end. The attached end is positioned over and in electrical contact with an anisotropic, conductive interposer which conducts electrical current in two directions along an axis through the interposer. The contactor includes an alignment mechanism for aligning the peripheral leads of the component to corresponding cantilevered spring contacts of the contactor. An interface board also contacts the anisotropic, conductive interposer. The interface board has a plurality of electrical pads. The anisotropic, conductive interposer provides a portion of the electrical path to the pads on the interface board when the cantilevered spring contacts contact the peripheral leads of the electrical component. The interface board is connected to the test electronics.

REFERENCES:
patent: 3702439 (1972-11-01), McGahey et al.
patent: 4068170 (1978-01-01), Chayka et al.
patent: 4419626 (1983-12-01), Cedrone et al.
patent: 4574235 (1986-03-01), Kelly et al.
patent: 4686468 (1987-08-01), Lee et al.
patent: 4747784 (1988-05-01), Cedrone
patent: 4835464 (1989-05-01), Slye et al.
patent: 5057904 (1991-10-01), Nagato et al.
patent: 5127837 (1992-07-01), Shah et al.
patent: 5136586 (1992-08-01), Greenblatt
patent: 5156649 (1992-10-01), Compton et al.
patent: 5171290 (1992-12-01), Olla et al.
patent: 5254834 (1993-10-01), Johnson
patent: 5277594 (1994-01-01), Matsuoka et al.
patent: 5307012 (1994-04-01), Bhattacharyya et al.
patent: 5336094 (1994-08-01), Johnson
patent: 5360348 (1994-11-01), Johnson
patent: 5452289 (1995-09-01), Sharma et al.
patent: 5479110 (1995-12-01), Crane et al.
patent: 5500605 (1996-03-01), Chang
patent: 5557212 (1996-09-01), Isaac et al.
patent: 5742171 (1998-04-01), Matsunaga et al.
"Manual Test Probing of Very Small Targets on the Top and Bottom of a Module Simultaneously", Research Disclosure, 2244 No. 329, Emsworth, GB, p. 656 (Sep. 1991).
Bove, R., "High Performance contactor", IBM Technical Disclosure Bulleitn, vol.18, No. 9, p. 2883 (Feb. 1976).
Byrnes, H.P., et al., "Pad Deformation Contactor", IBM Technical Disclosure Bulletin, vol. 21, No. 11, pp. 4511-4512 (Apr. 1979).
Johnson, D.A., et al., "Test Socket Performance Handbook", Published by Johnstech International Corporation, Cover page, Title page, pp. 1-37, 4 pages unnumbered (Oct. 1993).
Johnson, D.A., et al., Test Socket Performance Handbook, 1st Edition, Jonstech International, pp. 5-36, (1993) (month unavailable).
Shinetsu, Product Sheet for Interposed Material, pp. 1-19 (date unavailable).

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