Periodic probe mapping

Communications: directive radio wave systems and devices (e.g. – Determining distance – Material level within container

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Details

342 22, 342118, 73290R, 73291, 324629, 324637, 324642, 340603, 340612, 340618, 340620, G01S 1308

Patent

active

060782803

ABSTRACT:
A method and apparatus for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable for a material in a vessel. The method includes the steps of determining an initial reference signal along a probe, storing the initial reference signal as an active reference signal, periodically detecting a TDR signal along the probe in the vessel, and computing the output result using the TDR signal and the active reference signal. The method also includes the steps of determining an appropriate time for updating the active reference signal, automatically computing an updated reference signal at the appropriate time, and overwriting the active reference signal with the updated reference signal for use in subsequent computations of the output result.

REFERENCES:
patent: 3832900 (1974-09-01), Ross
patent: 3922914 (1975-12-01), Fuchs
patent: 3995212 (1976-11-01), Ross
patent: 4135397 (1979-01-01), Krake
patent: 4301681 (1981-11-01), Maltby et al.
patent: 4322832 (1982-03-01), Sartorius
patent: 4698634 (1987-10-01), Alongi et al.
patent: 4713538 (1987-12-01), Theocharous
patent: 4743906 (1988-05-01), Fullerton
patent: 4813057 (1989-03-01), Fullerton
patent: 4979186 (1990-12-01), Fullerton
patent: 5020374 (1991-06-01), Petroff et al.
patent: 5122800 (1992-06-01), Philipp
patent: 5226328 (1993-07-01), Petroff et al.
patent: 5323361 (1994-06-01), Elle et al.
patent: 5333508 (1994-08-01), Petroff et al.
patent: 5345471 (1994-09-01), McEwan
patent: 5361070 (1994-11-01), McEwan
patent: 5363108 (1994-11-01), Fullerton
patent: 5376888 (1994-12-01), Hook
patent: 5420517 (1995-05-01), Skaling et al.
patent: 5436580 (1995-07-01), Kellmann et al.
patent: 5457990 (1995-10-01), Oswald et al.
patent: 5517198 (1996-05-01), McEwan
patent: 5609059 (1997-03-01), McEwan
patent: 5610611 (1997-03-01), McEwan
patent: 5614911 (1997-03-01), Otto et al.
patent: 5656774 (1997-08-01), Nelson et al.
patent: 5661251 (1997-08-01), Cummings et al.
patent: 5677927 (1997-10-01), Fullerton et al.
patent: 5689265 (1997-11-01), Otto et al.
patent: 5734346 (1998-03-01), Richardson et al.
patent: 5767953 (1998-06-01), McEwan
patent: 5827985 (1998-10-01), Grieger et al.
patent: 5841666 (1998-11-01), Perdue et al.
patent: 5884231 (1999-03-01), Perdue et al.
Steven Arcone, "Conductivity Limitations in Single-Reflection Time-Domain Reflectometry," J. Phys. E. Sci. Instrum. 19 (1986), pp. 1067-1069.

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