Periodic jitter (PJ) measurement methodology

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C375S228000, C375S371000, C702S066000, C702S079000

Reexamination Certificate

active

07623977

ABSTRACT:
Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.

REFERENCES:
patent: 4982350 (1991-01-01), Perna et al.
patent: 6091671 (2000-07-01), Kattan
patent: 6246737 (2001-06-01), Kuglin
patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 6898535 (2005-05-01), Draving
patent: 7203610 (2007-04-01), Tabatabaei et al.
Search Report for International Application No. PCT/US05/45126 dated Jul. 1, 2008.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Periodic jitter (PJ) measurement methodology does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Periodic jitter (PJ) measurement methodology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Periodic jitter (PJ) measurement methodology will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4132022

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.