Periodic jitter (PJ) measurement methodology

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C375S228000, C375S371000, C702S066000, C702S079000

Reexamination Certificate

active

07400988

ABSTRACT:
Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.

REFERENCES:
patent: 4982350 (1991-01-01), Perna et al.
patent: 6246737 (2001-06-01), Kuglin
patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 6898535 (2005-05-01), Draving
patent: 2006/0047450 (2006-03-01), Tabatabaei et al.

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