Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-12-08
2008-07-15
Barlow, Jr., John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S228000, C375S371000, C702S066000, C702S079000
Reexamination Certificate
active
07400988
ABSTRACT:
Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.
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patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 6898535 (2005-05-01), Draving
patent: 2006/0047450 (2006-03-01), Tabatabaei et al.
Barlow Jr. John E
Dority & Manning P.A.
Guide Technology, Inc.
Le John H
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