Periodic jitter (PJ) measurement methodology

Details Periodic jitter (PJ) measurement methodology Periodic jitter (PJ) measurement methodology

2011-05-10

2011-05-10

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C375S228000, C375S371000, C702S066000, C702S079000

Reexamination Certificate

active

07941287

ABSTRACT:
Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.

REFERENCES:
patent: 4757452 (1988-07-01), Scott et al.
patent: 4908784 (1990-03-01), Box et al.
patent: 4982350 (1991-01-01), Perna et al.
patent: 6091671 (2000-07-01), Kattan
patent: 6181649 (2001-01-01), Kattan
patent: 6185509 (2001-02-01), Wilstrup et al.
patent: 6194925 (2001-02-01), Kimsal et al.
patent: 6226231 (2001-05-01), Kattan
patent: 6246737 (2001-06-01), Kuglin
patent: 6298315 (2001-10-01), Li et al.
patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 6456959 (2002-09-01), Kattan
patent: 6621767 (2003-09-01), Kattan
patent: 6665808 (2003-12-01), Schinzel
patent: 6701269 (2004-03-01), Jungerman et al.
patent: 6701280 (2004-03-01), Horne et al.
patent: 6822485 (2004-11-01), Kattan
patent: 6832172 (2004-12-01), Ward et al.
patent: 6876938 (2005-04-01), Kattan
patent: 6898535 (2005-05-01), Draving
patent: 6931335 (2005-08-01), Mueller
patent: 6931338 (2005-08-01), Kattan
patent: 6999382 (2006-02-01), Horne
patent: 7003180 (2006-02-01), Richardson et al.
patent: 7076385 (2006-07-01), Horne et al.
patent: 7164999 (2007-01-01), Tabatabaei et al.
patent: 7203610 (2007-04-01), Tabatabaei et al.
patent: 7239969 (2007-07-01), Tabatabaei et al.
patent: 7292947 (2007-11-01), Tabatabaei
patent: 7400988 (2008-07-01), Tabatabaei
patent: 7512196 (2009-03-01), Tabatabaei
patent: 2002/0084972 (2002-07-01), Kim
patent: 2002/0174159 (2002-11-01), Laquai
patent: 2003/0041294 (2003-02-01), Moll et al.
patent: 2003/0125888 (2003-07-01), Yamaguchi et al.
patent: 2003/0223376 (2003-12-01), Elliot et al.
patent: 2004/0136450 (2004-07-01), Guenther
patent: 2004/0143406 (2004-07-01), Nishikobara et al.
patent: 2004/0158462 (2004-08-01), Rutledge et al.
patent: 2004/0208129 (2004-10-01), Old et al.
patent: 2005/0044463 (2005-02-01), Frisch
patent: 2005/0075810 (2005-04-01), Laquai
patent: 2005/0097420 (2005-05-01), Frisch et al.
patent: 2005/0152488 (2005-07-01), Buckwalter et al.
patent: 2005/0177758 (2005-08-01), Stickle
patent: 2005/0243960 (2005-11-01), Jungerman
patent: 2005/0286670 (2005-12-01), Jungerman
patent: 2006/0045175 (2006-03-01), Draving et al.
patent: 2007/0110146 (2007-05-01), Tabatabaei
Search Report for International Application No. PCT/US05/45126 dated Jul. 1, 2008.
Technical Document—Jitter Separation-50 Mb/s To Over 40 Gb/s Using the Agilent 86100C Infiniium DCA-J; pp. 1 through 27, Agilent Technologies, Inc., Dec. 2003.
Technical Document—Analyzing Jitter Using a Spectrum Approach; pp. 1 through 8; Tektronix, Inc., 2002.
Technical Document—Measuring Jitter in Digital Systems, Application Note 1448-1, pp. 1 through 16, Agilent Technologies, Inc., Jun. 2003.

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