Periodic jitter characterization using pseudo-random sampling

Details Periodic jitter characterization using pseudo-random sampling Periodic jitter characterization using pseudo-random sampling

2006-05-23

2006-05-23

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S075000, C702S076000, C702S079000

Reexamination Certificate

active

07050915

ABSTRACT:
A method and system characterize jitter of an applied signal. The characterization includes acquiring a set of pseudo-randomly timed samples at a designated position on the signal, assigning a jitter value to each of the pseudo-randomly timed samples in the acquired set, and selecting a frequency from an array of frequencies based on a correlation of the assigned jitter values with the frequencies in the array. The periodic jitter associated with the signal is designated to have the frequency within the array of frequencies that has the highest correlation to the assigned jitter values.

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patent: EP 0 543 139 (1993-05-01), None
patent: WO 03/093842 (2003-11-01), None
GB Search Report Under Section 17 dated Feb. 23, 2005.

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