Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-05-27
2008-05-27
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S12100R
Reexamination Certificate
active
07379830
ABSTRACT:
A method and apparatus for determining the period Tpof a signal representing a digitally modulated waveform using NRZ coding with a discrete/integer number of a clock periods between signal transitions, where a periodic sequence of logic “1s” and logic “0s” is transmitted. The method samples an input periodic signal, constructs an estimate of the autocorrelation sequence rkof the sequence of samples, constructs a sequence of peaks pk, and computes the period Tpto be the time between the first pksample (k=0), and the time location of the maximum value of pkbased on the known Tsspacing of the pksequence samples.
REFERENCES:
patent: 5012494 (1991-04-01), Lai
patent: 6266172 (2001-07-01), Zirngibl
patent: 6285722 (2001-09-01), Banwell et al.
patent: 6608875 (2003-08-01), Wolaver
Barlow John
Le Toan M.
Lenihan Thomas F.
Tektronix Inc.
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