Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Subjective type
Patent
1990-12-28
1992-04-28
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Subjective type
351224, A61B 302
Patent
active
051081709
ABSTRACT:
The present invention relates to a perimetric instrument for measuring a range of a visual field of an eye of a man, and more particularly to a perimetric instrument which includes an abnormal visual field pattern analogical inferring section using a multilayer neural network and can analogically infer an abnormal visual field pattern of a measurement object person. Further, the present invention provides a perimetric instrument which can automatically make a determination of an additional target. In particular, according to the present invention, a multilayer neural network including an input layer, hidden layers and an output layer introduces a neural weight ratio which is determined based on responses when the visual field is normal and abnormal, and as a response from a responding section is inputted to the input layer while an output from the output layer is sent out to an analogical inferring section, the analogical inferring section can analogically infer an abnormal visual field pattern of the measurement object person. Accordingly, it is possible to help judgment of an abnormal visual field pattern by a measurer, and since also labor, time and so forth of the measurer are reduced, burdens to the measurer and them easurement object person can be reduced remarkably.
REFERENCES:
patent: 4561738 (1985-12-01), Humphrey et al.
Bovernick Rodney B.
Kabushiki Kaisha Topcon
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