Coded data generation or conversion – Sample and hold – Having variable sampling rate
Reexamination Certificate
2007-05-31
2009-02-24
Jeanglaude, Jean B (Department: 2819)
Coded data generation or conversion
Sample and hold
Having variable sampling rate
C314S120000, C314S124000
Reexamination Certificate
active
07495591
ABSTRACT:
Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.
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Fleischer-Reumann Michael
Moll Joachim
Schmitt Heiko
Agilent Technologie,s Inc.
Bobys Marc
Jeanglaude Jean B
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