Performing a signal analysis based on digital samples in...

Coded data generation or conversion – Sample and hold – Having variable sampling rate

Reexamination Certificate

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C314S120000, C314S124000

Reexamination Certificate

active

07495591

ABSTRACT:
Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

REFERENCES:
patent: 5909186 (1999-06-01), Gohringer
patent: 6498998 (2002-12-01), Furukawa
patent: 6700515 (2004-03-01), Asami
patent: 7023366 (2006-04-01), Walker et al.
patent: 2002/0030615 (2002-03-01), Cherubal et al.
patent: 2003/0016153 (2003-01-01), Wang et al.
patent: 2005/0219107 (2005-10-01), Guidry

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