Performance solid state detectors

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system

Reexamination Certificate

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Reexamination Certificate

active

08039808

ABSTRACT:
An imaging detector is formed from a conversion material and electrodes that are separated by trenches formed in the conversion material. The trenches increase the distance of the conductance path between electrodes or accommodate a grid of electrodes, thereby reducing current leakage between electrodes. In some embodiments, a passivation layer is used to provide improved adhesion of the electrodes to the conversion material or to shield the electrodes from grid electrode structures.

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