Performance of an atom interferometric device through...

Details Performance of an atom interferometric device through... Performance of an atom interferometric device through...

2008-12-17

2010-12-07

Connolly, Patrick J (Department: 2877)

Optics: measuring and testing

Velocity or velocity/height measuring

With light detector

C356S498000

Reexamination Certificate

active

07847924

ABSTRACT:
A technique is disclosed which offers an improvement in the performance of an atom interferometric (AI) sensor, such as one that is used in an accelerometer or a gyroscope. The improvement is based on the recognition that the AI-based device, which is associated with superior low-frequency performance, can be augmented with a conventional device having a superior high-frequency performance, as well as a wider frequency response, compared with that of the AI-based device. The disclosed technique combines acceleration measurements from the AI-based device, which is characterized by transfer function G(s), with acceleration measurements from the conventional device that have been adjusted by a complementary function, 1−Ĝ(s), where Ĝ(s) is an approximation of G(s). The conventional device has a considerably wider bandwidth than that of the AI-based device, and the quasi-unity transfer function of the conventional device makes possible the 1−Ĝ(s) adjustment of the measurements provided by the conventional device.

REFERENCES:
patent: 3992953 (1976-11-01), Ljung et al.
patent: 5532565 (1996-07-01), Vervoordeldonk
patent: 7209219 (2007-04-01), Butler
patent: 2002/0123857 (2002-09-01), Bjorset, Sr.
patent: 2004/0176861 (2004-09-01), Butler
patent: 2007/0194982 (2007-08-01), Stove
Jekeli, Christopher, “Navigation Error Analysis of Atom Interferometer Inertial Sensor”, “Navigation: Journal of The Institute of Navigation Spring 2005”, , vol. 52, No. 1, Publisher: The Institute of Navigation, Inc., Published in: US.

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