Performance characterization using effective processor...

Details Performance characterization using effective processor... Performance characterization using effective processor...

2006-06-13

2006-06-13

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C713S322000, C713S501000

Reexamination Certificate

active

07062394

ABSTRACT:
An embodiment of the present invention includes a method to analyze processor performance. A processor is saturated with a workload. The processor has a specified operating frequency and a thermal throttling range from a minimum throttling state to a maximum throttling state. Events are sampled for a pre-determined time interval at a sampling rate during the workload. An effective processor frequency is calculated using the sampled events, the pre-determined time interval, and the sampling rate.

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