Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1988-05-16
1990-09-11
Warden, Robert J.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
165 61, 252 54, 568615, 568683, G01N 2500
Patent
active
049557262
ABSTRACT:
Perfluoropolyethers having an average molecular weight higher than 390 and respectively having a kinematic viscosity lower than 8.5 cSt (at 20.degree. C.), and such as to distill by not more than 10% at temperatures lower than 140.degree. C., and by at least 90% at temperatures not higher than 260.degree. C., or, in the case in which the perfluoropolyether does not contain CF(CF.sub.3)CF.sub.2 O units, having a viscosity lower than 18 cSt (at 20.degree. C.), and such as to distill by not more than 10% at temperatures lower than 140.degree. C., and by at least 90% at temperatures not higher than 280.degree. C., are used as the only high-temperature and low-temperature working fluid in the Thermal Shock Tests to which the electronic components are submitted, and at the same time are advantageously used in other tests used in the electronic industry, such as the Gross Leak Test and the Burn in Test, allowing the operators in this field to use one single fluid for a whole set of uses.
REFERENCES:
patent: 3214478 (1965-10-01), Milian
patent: 3242218 (1966-03-01), Miller
patent: 3665041 (1972-05-01), Sianesi et al.
patent: 4523039 (1985-06-01), Lagow et al.
Bargigia Gianangelo
Caporiccio Gerardo
Flabbi Luciano
Marchionni Giuseppe
Tonelli Claudio
Alfandary-Alexander Lyle
Montedison S.p.A.
Warden Robert J.
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