Perfluoropolyether liquid pellicle and methods of cleaning...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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07022437

ABSTRACT:
A patterning device, for example a mask, for use in a photolithographic apparatus includes a blank layer, a layer of patterned opaque material on a surface of the blank layer and a pellicle of perfluoropolyether (PFPE) liquid that covers the surface. A method of manufacturing a patterning device includes providing a patterning device having a blank layer and a patterned layer of opaque material on a surface of the blank layer, applying PFPE liquid to the surface that covers the surface to form a PFPE liquid layer, and removing at least a portion of the PFPE liquid layer. A method of cleaning a patterning device for use in photolithographic projection apparatus, the patterning device including a blank layer and a patterned layer of opaque material on a surface of the blank layer, the method including applying PFPE liquid to the surface of the blank layer that covers the surface to form a PFPE liquid layer and removing at least a portion of the PFPE liquid layer.

REFERENCES:
patent: 4711256 (1987-12-01), Kaiser
patent: 5061024 (1991-10-01), Keys
patent: 5168001 (1992-12-01), Legare et al.
patent: 6280885 (2001-08-01), Gordon
patent: 10308337 (1998-11-01), None
patent: WO 02/093261 (2002-11-01), None
M. Switkes et al., “Resolution Ehancement of 157 nm Lithography by liquid Immersion,” Proceedings of SPIE, vol. 4691, 2002, pp. 459-465.

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