Penetrameter and method of use

X-ray or gamma ray systems or devices – Accessory – Testing or calibration

Patent

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Details

378162, G01D 1800

Patent

active

052107833

ABSTRACT:
A penetrameter is provided for use in evaluating the resolution of an x-ray inspection system as well a method for calibrating the resolution of the x-ray inspection system. The penetrameter comprises a radiolucent substrate, and at least one filament at the radiolucent substrate, the at least one filament being broken by a gap having a predetermined size. The method of determining the resolution of an x-ray inspection system comprises steps of: generating a radiographic image of the penetrameter, determining if the broken filament is visible, and if the broken filament is visible, determining if the gap is visible.

REFERENCES:
patent: 5095499 (1992-03-01), Wentz

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