X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Patent
1992-06-03
1993-05-11
Church, Craig E.
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
378162, G01D 1800
Patent
active
052107833
ABSTRACT:
A penetrameter is provided for use in evaluating the resolution of an x-ray inspection system as well a method for calibrating the resolution of the x-ray inspection system. The penetrameter comprises a radiolucent substrate, and at least one filament at the radiolucent substrate, the at least one filament being broken by a gap having a predetermined size. The method of determining the resolution of an x-ray inspection system comprises steps of: generating a radiographic image of the penetrameter, determining if the broken filament is visible, and if the broken filament is visible, determining if the gap is visible.
REFERENCES:
patent: 5095499 (1992-03-01), Wentz
Church Craig E.
Katz Eric R.
Lockheed Corporation
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