Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2005-12-09
2009-08-11
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
Reexamination Certificate
active
07574328
ABSTRACT:
Determining a property of a measured peak pattern having at least one peak includes extracting measured peak parameters from the measured peak pattern, and determining deviations of the measured peak parameters from reference values of a reference peak pattern. The reference peak pattern is represented by a spring model, with peak parameters being represented by corresponding springs. Determining a property of a measured peak pattern also includes determining a deformation energy necessary for deforming the reference peak pattern in a way that the deformed reference peak pattern substantially represents the measured peak pattern.
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Khuu Cindy H
Nghiem Michael P.
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