Patterned silicon-on-insulator layers and methods for...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means

Reexamination Certificate

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C257SE21563

Reexamination Certificate

active

07659599

ABSTRACT:
In an aspect, a method is provided for forming a silicon-on-insulator (SOI) layer. The method includes the steps of (1) providing a silicon substrate; (2) selectively implanting the silicon substrate with oxygen using a low implant energy to form an ultra-thin patterned seed layer; and (3) employing the ultra-thin patterned seed layer to form a patterned SOI layer on the silicon substrate. Numerous other aspects are provided.

REFERENCES:
patent: 5956597 (1999-09-01), Furukawa et al.
patent: 2003/0104658 (2003-06-01), Furukawa et al.
patent: 2006/0231892 (2006-10-01), Furukawa et al.

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