Patent
1985-12-13
1987-09-22
James, Andrew J.
357 67, H01L 2352, H01L 2354
Patent
active
046958681
ABSTRACT:
Large areas of metallization on a semiconductor surface are replaced with an interconnected pattern of metallization. When an area of metallization is covered with a layer of dielectric glass having a thermal coefficient of expansion substantially different from that of the metallization, use of the subject interconnected pattern of metallization significantly enhances the stability of the structure to thermal stress.
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Clark S. V.
James Andrew J.
Limberg Allen LeRoy
RCA Corporation
Swope R. Hain
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