Pattern tracer with electronic kerf, calibration and line width

Details Pattern tracer with electronic kerf, calibration and line width Pattern tracer with electronic kerf, calibration and line width

1983-10-03

1987-03-03

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

318577, G05B 100, G05B 1933

Patent

active

046477608

ABSTRACT:
A pattern tracer with circuitry for electronically adjusting the lateral offset of the tracing element for kerf compensation, that produces a control signal based on a temporal relationship between a reference signal and a pattern detection signal associated with a preselected kerf compensation. The pattern is traced with the selected lateral offset in accordance with a control signal. The control signal is developed in response to both a line width compensation signal and a kerf compensation signal. A photometric detector is calibrated by electronically adding a compensation angle to a pattern detection angle to compensate for any physical misalignment of the detector.

REFERENCES:
patent: Re30938 (1982-05-01), Kallen
patent: 3920316 (1975-11-01), Daguillon
patent: 4160199 (1979-07-01), Bardwell
patent: 4396832 (1983-08-01), Henderson
patent: 4453084 (1984-06-01), Brouwer
patent: 4578574 (1986-03-01), Grant et al.

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