Pattern tracer with dual scan slowdown circuit

Details Pattern tracer with dual scan slowdown circuit Pattern tracer with dual scan slowdown circuit

1985-01-22

1987-04-21

LaRoche, Eugene R.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

318577, G05B 100

Patent

active

046599185

ABSTRACT:
In a circular scanning pattern tracing system, a dual scanning pattern is provided to detect pattern changes in advance of the system steering axis. Pattern detection pulses from both the scanning patterns are adjustable in length and the overlap of the pulses is used to determine whether the system should slow down.

REFERENCES:
patent: 3704372 (1972-11-01), Parker et al.
patent: 3860862 (1975-01-01), Dell et al.
patent: 3883735 (1975-05-01), Murphy et al.

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