Pattern testing apparatus

Details Pattern testing apparatus Pattern testing apparatus

1982-05-24

1984-09-18

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358101, 358126, 356237, H04N 718

Patent

active

044727380

ABSTRACT:
A pattern defect testing apparatus comprises a first detection circuit which defines a first detection area on a two-dimensional pattern and produces a first detection signal when all digital signals representative of densities of picture cells in the first detection area have the same logical value, a second detection circuit which defines a second detection area on the two-dimensional pattern and produces a second detection signal when at least one of digital signals representative of densities of picture cells in the second detection area has a logical value different from that of the digital signals to the first detection circuit, and a discriminating circuit for discriminating the presence of a defect in the second detection area when the first and second detection signals are produced.

REFERENCES:
patent: 4124865 (1978-11-01), Zwirn
patent: 4319269 (1982-03-01), Kajiura
patent: 4353087 (1982-10-01), Berry et al.
patent: 4364089 (1982-12-01), Woolfson
patent: 4380025 (1983-04-01), Deane

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