Pattern recognizing method and apparatus

Image analysis – Pattern recognition – Classification

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382190, G06K 962

Patent

active

056712936

ABSTRACT:
A pattern recognizing apparatus comprises a feature vector extractor to extract a feature vector of an input pattern; a converting unit to convert the feature vector extracted by the feature vector extractor into the feature vector which is effective for selection between categories; a classification processing unit for calculating an inner product with a predetermined basic vector for the converted vector after the conversion was performed by the converting unit; and a category selecting unit for selecting and outputting a category group to which the input pattern belongs with reference to a predetermined category table on the basis of the result of the calculation by the classification processing unit.

REFERENCES:
patent: 4155072 (1979-05-01), Kana
patent: 4228421 (1980-10-01), Asada
patent: 4292471 (1981-09-01), Kuhn et al.
patent: 4319221 (1982-03-01), Sakoe
patent: 4503557 (1985-03-01), Maeda
"A Data Clustering Algorithm For Feature Extraction & Unsupervised Learning", B.E. Gala, IEEE Proc. Of The Conf. On Computer Graphics, Pattern Recognition And Data Structure, May 14, 1975, pp. 323-331.
"Feature Evaluation And Sub-Class Determination Through Functional Mapping", M. Shridhar, Pattern Recognition Letters, vol. 3, No. 3, May 1985, pp. 155-159.
"Random Vectors And Their Properties", K. Fukunaga, Introduction To Statistical Pattern Recognition, 1994, pp. 11-50.
"Parametric Classifiers", K. Fukunaga, Introduction To Statistical Pattern Recognition, 1994, pp. 124-180.
Otsu, Nobuyuki, "Mathematical Studies on Feature Extraction in Pattern Recognition", Study Report of the Electrotechnical Laboratory, cover page, pp. 78-83, last page, Jul. 1981 (Japanese).
Otsu, Nobuyuki, "Mathematical Studies on Feature Extraction in Pattern Recognition", Study Report of the Electrotechnical Laboratory, English-language synopsis, Jul. 1981.

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