Image analysis – Pattern recognition – Classification
Patent
1996-07-17
1999-08-10
Vu, Kim Yen
Image analysis
Pattern recognition
Classification
382195, 382218, 382225, G06K 964
Patent
active
059370939
ABSTRACT:
The detection of a nearest neighbor is calculated at high speed and with high accuracy. Feature space grouping is performed, with one, or two or more features being assigned to each group. A check is performed to determine whether or not a calculated distance value that is acquired before the limits for a group is reached has exceeded the threshold value THR.sub.-- MIX for each group. The threshold value that is set for THR.sub.-- MIX is the average of the threshold value that is determined based on the cumulative quantity of the features that is acquired and the threshold value that is based on the number of dimensions. When the distance value for each group is greater than the threshold value THR.sub.-- MIX, first phase screening is performed to exclude, from the succeeding distance calculations, the prototype that provides that distance value. Then, for a group for which the first phase screening is performed, the threshold value THR.sub.-- RATE is calculated by using the minimum distance value to that group, and the second phase screening is performed.
REFERENCES:
patent: 5034991 (1991-07-01), Hagimae et al.
patent: 5060277 (1991-10-01), Bokser
patent: 5479523 (1995-12-01), Gaborski et al.
patent: 5602938 (1997-02-01), Akiyama et al.
patent: 5748843 (1998-05-01), Peck et al.
Sone, Hironao et al., "Easy High-Speed Discrimination Method Using Hierarchical Pattern Matching", 1986, pp. 1-9.
Clay A. Bruce
International Business Machines Corp.
Rosenblum David
Vu Kim Yen
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