Image analysis – Pattern recognition
Reexamination Certificate
2007-02-16
2011-10-18
Desire, Gregory M (Department: 2624)
Image analysis
Pattern recognition
C244S158100, C382S276000, C382S294000
Reexamination Certificate
active
08041118
ABSTRACT:
In an exemplary embodiment, a pattern is recognized from digitized images. A first image metric is computed from a first digitized image and a second image metric is computed from a second digitized image. A composite image metric is computed as a function of the first image metric and the second image metric, and a pattern is identified by comparing the composite image metric against a reference image metric. The function may be a simple average or a weighted average. The image metric may include a separation distance between features, or a measured area of a feature, or a central angle between two arcs joining a feature to two other features, or an area of a polygon whose vertices are defined by features, or a second moment of a polygon whose vertices are defined by features. The images may include without limitation images of friction ridges, irises, or stars.
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Desire Gregory M
The Boeing Company
Toler Law Group
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