Pattern recognition by unsupervised metric learning

Details Pattern recognition by unsupervised metric learning Pattern recognition by unsupervised metric learning

1995-07-17

1998-06-30

Boudreau, Leo

Image analysis

Learning systems

Trainable classifiers or pattern recognizers

382118, 382225, 382228, G06K 962

Patent

active

057745765

ABSTRACT:
A pattern recognition method uses unsupervised metric learning starting from a mixture of normal densities which explains well observed data. An improved decision rule is provided for selecting the reference database element most likely to correspond to a query.

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