Image analysis – Pattern recognition
Reexamination Certificate
2006-03-09
2010-02-09
Mehta, Bhavesh M (Department: 2624)
Image analysis
Pattern recognition
Reexamination Certificate
active
07660465
ABSTRACT:
A pattern recognition apparatus compares an image including a photographed object to be recognized with a model previously registered in a table and recognizes the object to be recognized, and the pattern recognition apparatus includes an image input part1, a feature point extraction part2, a triangulation part3, a feature point selection part4, a basis calculation part5, a partial pattern structure part6, an index calculation part7, a table registration part8, a pattern similarity calculation part9, a hypothesis information generation part10, and an object recognition part11. Plural feature points are extracted from the image of the object to be recognized, triangulation of a feature point set is obtained, and a combination of plural feature points is selected from plural feature points in accordance with the extracted triangulation.
REFERENCES:
patent: 5638465 (1997-06-01), Sano et al.
patent: 6642929 (2003-11-01), Essafi et al.
patent: 2003/0128876 (2003-07-01), Yamaguchi
patent: 2003-242509 (2003-08-01), None
Kabushiki Kaisha Toshiba
Liew Alex
Mehta Bhavesh M
Turocy & Watson LLP
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