Image analysis – Histogram processing – For setting a threshold
Patent
1983-06-14
1985-12-03
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 34, 382 36, G06K 912
Patent
active
045569851
ABSTRACT:
A pattern recognition apparatus for identifying characters for example comprises a scanner and data extraction circuit which obtains a rectangular sized M.times.N bit pattern matrix B(i,j) representing the presence and configuration of an unknown scanned pattern in subregions (i,j) of a frame which substantially encloses the scanned pattern, wherein each bit in the pattern has a pattern present value when the scanned pattern falls at least partially within its associated subregion and a pattern absent value when the scanned pattern does not fall within its associated subregion. A processor compares the bit pattern matrix with a plurality of previously obtained bit pattern matrices B.sub.S.sup.K (i,j) for a respective plurality of known reference patterns K, and outputs for each reference pattern K a comparison quantity value D.sup.K whose amplitude represents the degree of correspondence between the bit pattern matrix B(i,j) from scanning the unknown pattern and the bit pattern matrices B.sub.S.sup.K (i,j) for each reference pattern K. The processor then selects the lowest and next lowest comparison quantity values and outputs a pattern identification signal which identifies the unknown pattern as the reference pattern corresponding to the lowest quantity value if this value is less than a first preset value, and if the difference between the lowest and next lowest comparison quantity values is greater than a second preset value.
REFERENCES:
patent: 3178688 (1965-04-01), Hill et al.
patent: 3576534 (1971-04-01), Steinberger
patent: 3601802 (1971-08-01), Nakagome et al.
patent: 3618016 (1971-11-01), Van Steenis
patent: 3846754 (1974-11-01), Oka et al.
patent: 4110737 (1978-08-01), Fahey
patent: 4162482 (1979-07-01), Su
patent: 4183013 (1980-01-01), Agrawala et al.
patent: 4398256 (1983-08-01), Nussmeier et al.
"Stamped Character Inspection Apparatus Based on the Bit Matrix Method" Y. Hongo and A. Komuro, Proceedings of 6th Int. Conf. on Pattern Rec., Oct., 1982, pp. 448-450.
Boudreau Leo H.
Fuji Electric Company, Inc.
LandOfFree
Pattern recognition apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pattern recognition apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern recognition apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1398458