Pattern position recognizing apparatus

Image analysis – Histogram processing – For setting a threshold

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382 8, 382 34, G06K 900

Patent

active

050143301

ABSTRACT:
A pattern recognition apparatus detects a coincidence between an input image pattern and a target pattern. Input image data f.sub.ij are received, where f.sub.ij denotes a concentration of the input image pattern at a picture element i,j on a two-dimensional plane of the input image pattern. Mask data g.sub.uv is stored, where g.sub.uv denotes a concentration of the target pattern at a point u,v on a two-dimensional plane of the target pattern. The mask data g.sub.uv is scanned with respect to the input image data f.sub.ij and a proportional coefficient is computed corresponding to each picture element i,j of the two two-dimensional plane of the input image pattern. The proportional coefficient denotes a ratio between the concentration of the input image data f.sub.ij and the concentration of the mask data g.sub.uv. The input image data f.sub.ij is divided into a plurality of partial templates denoting a two-dimensional subsection of the input image pattern. For each partial template, a proportional evaluation index .sigma..sub.ij is calculated corresponding to each picture element i,j of the two-dimensional plane of the input image pattern. The proportional evaluation index .sigma..sub.ij denotes a degree of dispersion of the proportional coefficients within each partial template. Be examining the dispersion of the proportional coefficients, a pattern coincidence can be detected.

REFERENCES:
patent: 4707734 (1987-11-01), Lambinger et al.
patent: 4882763 (1989-11-01), Buchan et al.

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