Pattern measurement method, manufacturing method of...

Image analysis – Pattern recognition – Feature extraction

Reexamination Certificate

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Details

C250S559220, C250S559360, C382S144000, C382S145000, C382S199000

Reexamination Certificate

active

07151855

ABSTRACT:
A pattern measurement method includes acquiring graphic data of a plurality of patterns including image data; processing the graphic data to detect a coordinate of an edge point of the pattern; combining the edge points between the patterns to make a pair of edge points and calculating a distance between the edge points constituting each pair of edge points and an angle between a straight line which connects the edge point to the other edge point and an arbitrary axial line with respect to each pair of edge points to prepare a distance angle distribution map which is a distribution map of the calculated distance and angle of the pair of edge points; and evaluating at least one of a relation of shape between the patterns, a relation of size between the patterns, and a relative location between the patterns on the basis of the prepared distance angle distribution map.

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