Image analysis – Histogram processing – For setting a threshold
Patent
1987-02-27
1989-02-14
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 14, 382 30, 382 34, G06K 962
Patent
active
048052248
ABSTRACT:
Disclosed is a pattern matching method and apparatus, in which an object pattern is collated with a master pattern using pattern matching. As a first step, an area corresponding to a master pattern size is sequentially extracted from a master sample image for forming the master pattern, each extracted pattern is collated and the other patterns in the master sample image. An extracted pattern which has a minimum similarity to all the other patterns, and, as a result, shows the most distinctive pattern, is used for the master pattern. Using the present method and apparatus, pattern matching having a higher recognition rate can be performed. Further, using the present pattern matching method, an apparatus can be obtained for positioning the object to be recognized with a highest positioning accuracy.
REFERENCES:
patent: 3898617 (1975-08-01), Kashioka et al.
patent: 4200861 (1980-04-01), Hubach et al.
patent: 4435835 (1984-03-01), Sakow et al.
patent: 4441205 (1984-04-01), Beritin et al.
Philips Technical Review, vol. 38, No. 11/12, 1978/1979, pp. 356-363; E. H. J. Persoon: "A System That Can Learn to Recognize Two-Dimensional Shapes".
European Search Report, The Hague, 03-25-88.
J. S. Boland et al., "Design of a Correlator for Real-Time Video Comparison", 1-79.
Koezuka Tetsuo
Nakashima Masato
Tsukahara Hiroyuki
Boudreau Leo H.
Fujitsu Limited
LandOfFree
Pattern matching method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pattern matching method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern matching method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1372143