Image analysis – Applications – Manufacturing or product inspection
Patent
1994-06-09
1996-07-16
Boudreau, Leo
Image analysis
Applications
Manufacturing or product inspection
382173, 348 87, G06K 900
Patent
active
055374875
ABSTRACT:
A method of dividing a block pattern for use in a block exposure, to be implemented on a computer, divides an arbitrary block which is to be formed in a block mask that is used for the block exposure when the arbitrary block is judged as including a prohibiting pattern which is undesirable from a point of view of the block exposure. This method comprises the steps of (a) dividing the arbitrary block in a first direction to obtain a first block having a first dividing width along a second direction which is perpendicular to the first direction, (b) dividing a remaining block portion of the arbitrary block excluding the first block in the first direction to obtain a first divided portion having a second dividing width along the second direction, and merging the first dividing portion to the first block if the second dividing width is less than a predetermined width, and (c) searching the first block in the first direction after the step (b) and merging one of two adjacent first patterns within the first block to a second block if a pattern interval which is less than a predetermined value extends along the first direction between the first patterns.
REFERENCES:
patent: 4510616 (1985-04-01), Lougheed et al.
patent: 4811409 (1989-03-01), Cavan
patent: 5046012 (1991-09-01), Morishita et al.
patent: 5287290 (1994-02-01), Tabara et al.
Miyajima Masaaki
Sakamoto Kiichi
Yamazaki Satoru
Yasuda Hiroshi
Anderson David R.
Boudreau Leo
Fujitsu Limited
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