Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2003-12-16
2009-08-18
Chawan, Sheela C (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S118000, C382S243000, C375S213000
Reexamination Certificate
active
07577297
ABSTRACT:
In a pattern identification device performing pattern identification of data which has been input by hierarchically extracting features, a primary feature is extracted and distribution of at least one feature extraction result extracted is analyzed, a secondary feature is extracted according to this analysis result. Thus, it is possible to perform pattern identification robustly against fluctuations of the input pattern at a reduced processing cost while reducing the probability of occurrence of incorrect identification.
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Ishii Mie
Matsugu Masakazu
Mitarai Yusuke
Mori Katsuhiko
Canon Kabushiki Kaisha
Chawan Sheela C
Fitzpatrick ,Cella, Harper & Scinto
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