Pattern generator for cycle delay

Excavating

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371 62, 395552, G01R 3128

Patent

active

056823932

ABSTRACT:
A pattern generator facilitates the pattern generation of an electronics device to be measured such as SDRAM where each input and output signal cycle is not matched. The pattern generator includes a first address signal delay section that applies a cycle delay to a first address signal based on the number set in a first delay register, a second address signal delay section that applies a cycle delay to a second address signal based on the number set in a second delay register, a data signal delay section that applies a cycle delay to a data signal based on the number set in a data delay register, a control signal delay section that applies cycle delay to a control signal based on the number set in a control delay register.

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patent: 5426771 (1995-06-01), Asprey et al.

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