Pattern features extracting apparatus and method

Details Pattern features extracting apparatus and method Pattern features extracting apparatus and method

1983-04-14

1985-09-24

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 27, 382 36, 382 41, G06K 964

Patent

active

045436606

ABSTRACT:
A plurality of different mask pattern data which are indicated by values obtained from Hermitte's polynomials of different degrees weighted by a Gaussian function are stored in mask memories, respectively. Each mask pattern data stored in each of the mask memories is convolved by a sum-of-product circuit together with unknown input pattern data. A plurality of extracted pattern feature data are stored in pattern feature memories.

REFERENCES:
patent: 3846752 (1974-11-01), Nakano et al.
patent: 3906446 (1975-09-01), Iijima et al.
patent: 4074231 (1978-02-01), Yajima et al.
patent: 4319221 (1982-03-01), Sakoe

Affiliated with

Also associated with

Rating

Pattern features extracting apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pattern features extracting apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern features extracting apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1617652