Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-09-25
2007-09-25
Mehta, Bhavesh M (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S145000
Reexamination Certificate
active
10252521
ABSTRACT:
a pattern evaluation system which receives image data of a pattern to be evaluated to evaluate the pattern includes an edge model producing part which produces a pattern edge model and an edge point coordinate detecting part which carries out an image matching processing to an image of the pattern with the pattern edge model to detect coordinates of an edge point of the pattern.
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U.S. Appl. No. 2002/0141647, titled Pattern Evaluation Method, Pattern Evaluation System and Computer Readable-Recorded Medium, published Oct. 3, 2002.
Mehta Bhavesh M
Strege John B
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