Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2010-03-03
2011-12-27
Chang, Jon (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S149000
Reexamination Certificate
active
08086041
ABSTRACT:
A pattern evaluation method includes: generating first array data from edge data on a pattern to be evaluated, the edge data on the pattern to be evaluated being shape data including edge points of the pattern to be evaluated; generating second array data from edge data on a reference pattern, the edge data on the reference pattern including edge points of the reference pattern which serves as an inspection standard of the pattern to be evaluated; subjecting each component of the second array data to array conversion processing, the array conversion processing being designed to convert a value of the component of the second array data into a function value of a value of a distance from that component to the edge point closest thereto, thereby generating third array data; executing arithmetic processing between the first array data and the third array data to generate fourth array data; and using a component of the fourth array data to calculate a numerical value representative of an relation between the pattern to be evaluated and the reference pattern.
REFERENCES:
patent: 4477926 (1984-10-01), Linger et al.
patent: 5982922 (1999-11-01), Moriya
patent: 6064484 (2000-05-01), Kobayashi et al.
patent: 6148097 (2000-11-01), Nakayama et al.
patent: 6413688 (2002-07-01), Akutagawa et al.
patent: 6538260 (2003-03-01), Koga
patent: 6868175 (2005-03-01), Yamamoto et al.
patent: 7076093 (2006-07-01), Lee et al.
patent: 2002/0141634 (2002-10-01), Nishizaka et al.
patent: 2003/0059104 (2003-03-01), Mitsui
patent: 2004/0066964 (2004-04-01), Neubauer et al.
patent: 2005/0086618 (2005-04-01), Ito et al.
patent: 55-028112 (1980-02-01), None
patent: 8-194734 (1996-07-01), None
patent: 10-111108 (1998-04-01), None
patent: 10-170241 (1998-06-01), None
patent: 2002-277236 (2002-09-01), None
Notification of Reasons for Rejection issued by the Japanese Patent Office on Aug. 13, 2010, for Japanese Patent Application No. 2005-098513, and English-language translation.
Notification of Reasons for Rejection for corresponding Japanese Patent Application No. 2005-098513, 3pp.
Notification of Reasons for Rejection issued by the Japanese Patent Office on Sep. 16, 2011, for Japanese Patent Application No. 2011-093110, and English-language translation thereof.
Decision of Final Rejection issued by the Japanese Patent Office on Sep. 16, 2011, for Japanese Patent Application No. 2005-098513, and English-language translation thereof.
Chang Jon
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
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