Image analysis – Pattern recognition
Reexamination Certificate
2005-07-29
2010-02-23
Johns, Andrew W (Department: 2624)
Image analysis
Pattern recognition
Reexamination Certificate
active
07668373
ABSTRACT:
A pattern evaluation method includes: acquiring an image of a pattern to be evaluated, detecting edge points of the pattern from the image, creating a parameter curve having the detected edge points as control points thereof, and evaluating the pattern based on the created parameter curve.
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Notification of Reason for Rejection issued by the Japanese Patent Office on Sep. 19, 2008, for Japanese Patent Application No. 2004-223511, and English-language translation thereof.
Notification of Reasons for Rejection issued by the Japanese Patent Office on Jan. 30, 2009, in counterpart Japanese Application No. 2004-223511 and English translation thereof.
Cunningham Gregory F
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Johns Andrew W
Kabushiki Kaisha Toshiba
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