Pattern distance calculating equipment

Details Pattern distance calculating equipment Pattern distance calculating equipment

1985-07-23

1986-07-15

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

381 42, 381 43, 382 34, 382 36, G06K 962, G10L 506

Patent

active

046010548

ABSTRACT:
A pattern recognition apparatus for recognizing spoken words of a nonspecific speaker or of a specific speaker. A reference pattern composed of a sequence of feature vectors, each composed of n feature parameters, b.sub.i, is stored. The reference pattern represents a form of average of said words to be recognized as determined by multiple reference speakers speaking the same words or by the specified speaker speaking said words several times. A deviation pattern composed of a sequence of feature vectors composed of n feature parameters, w.sub.i /2, is stored. The deviation pattern is a measure of the deviation from the reference of the repeated utterances of the reference speakers or the specified speaker. An input pattern, representing the utterances of a speaker, is composed of a sequence of feature vectors, each composed of n feature parameters, a.sub.i, and is stored. A measure of the similarity of the input and reference patterns is calculated, taking into account the deviation pattern, according to one of several possible distance formulae. Basically, a distance parameter calculated for each corresponding input, reference and deviation parameter is set to zero value if the input parameter is inside the deviation range of the reference parameter, and is otherwise calculated to be a finite value.

REFERENCES:
patent: 3700815 (1972-10-01), Doddington et al.
patent: 4292471 (1981-09-01), Kuhn et al.
patent: 4403114 (1983-09-01), Sakoe

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