Pattern detection method

Details Pattern detection method Pattern detection method

1995-11-07

1999-06-15

Chang, Jon

Image analysis

Applications

Manufacturing or product inspection

382217, 382291, G06K 962

Patent

active

059129859

ABSTRACT:
When an image of an object is recognized, a template having a size smaller than the object is used. First, operation reference points C.sub.s (X.sub.m, Y.sub.n) are set at steps smaller than lengths along the X and Y directions of an image of an object to be recognized, and a template T(x.sub.i, y.sub.i) is set at the operation reference points C.sub.s (X.sub.m, Y.sub.n). Then, an equation, ##EQU1## is operated based on the template T(x.sub.i, y.sub.i) and the image data P(X, Y). Next, candidate points are determined as points having M(X.sub.m, Y.sub.n) larger than a reference value. Then, a position of the image of the object is determined according to the candidate points. Even if an image to be recognized is inclined, the position and the slope of the image can be detected at a fast speed even for image data with noise.

REFERENCES:
patent: 5018218 (1991-05-01), Peregrim et al.
patent: 5136661 (1992-08-01), Kobayasi et al.
patent: 5185811 (1993-02-01), Beers et al.
patent: 5204911 (1993-04-01), Schwartz et al.
patent: 5226095 (1993-07-01), Okumura et al.
Gonzalez et al. Digital Image Processing. Addison-Wesley Publishing Co., pp. 418-425, 1992.

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