Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2006-06-13
2006-06-13
Geyer, Scott (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C438S017000, C365S201000
Reexamination Certificate
active
07060512
ABSTRACT:
A method and apparatus for building a memory module using improved patching schemes comprises, mounting multiple primary and secondary memory parts on a multi-layer circuit board, positioning I/O bit line patching networks adjacent to the primary and secondary memory parts, matching read/write control signals for primary and secondary memory parts which share I/O bit line patching networks, testing primary and secondary memory parts to identify non-operable I/O lines, and patching any non-operable I/O line of a primary memory part by replacing it with a fully operable I/O line of its associated backup memory part. The method and apparatus include multi-layer circuit boards which utilize 2-to-1, 4-to-1, and 8-to-1 patching configurations.
REFERENCES:
patent: 5644541 (1997-07-01), Siu et al.
patent: 5987623 (1999-11-01), Ushida
patent: 6057169 (2000-05-01), Singh et al.
Celetronix, Inc.
Fish Paul W.
Geyer Scott
Nichols Steven L.
Rader Fishman and Grauer PLLC
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