Patch measurement device

Details Patch measurement device Patch measurement device

2007-04-10

2007-04-10

Grant, II, Jerome (Department: 2625)

Facsimile and static presentation processing

Static presentation processing

Attribute control

C358S504000, C358S520000

Reexamination Certificate

active

10186711

ABSTRACT:
In a patch measurement device, a data storage section stores printed-image data including a control strip on a printed material. Based on the pixel values constituting printed-image data stored in the data storage section, a patch position detection section detects the position of a patch. A color density measurement section measures the color density of the patch whose position has been detected by the patch position detection section. A correlation coefficient ρm between a key pattern x and subject data y which is calculated by a reference mark detection section is represented as ρm=([x]*[y])−([x]−1*[y]), where [x]*[y] is a sum of multiplication products of corresponding elements of the two matrices. Matrix [x]−1represents an inverted pattern of the key pattern x. Even if the subject data y is of an unrelated pattern resembling the key pattern x having different signal levels from those of the key pattern x, the resultant correlation coefficient ρm has a small value, thereby indicative of a low correlation. The resultant correlation coefficient ρm also becomes small if the subject data y is that of a solid patch, due to cancellation by a drastic subtraction.

REFERENCES:
patent: 4003660 (1977-01-01), Christie, Jr. et al.
patent: 5182721 (1993-01-01), Kipphan et al.
patent: RE35495 (1997-04-01), Bolza-Schuenemann et al.
patent: 5724259 (1998-03-01), Seymour et al.
patent: 5754676 (1998-05-01), Komiya et al.
patent: 5978506 (1999-11-01), Murayama et al.
patent: 5992318 (1999-11-01), DiBello et al.
patent: 6041708 (2000-03-01), Kipphan et al.
patent: 6100982 (2000-08-01), Tobias et al.
patent: 6109183 (2000-08-01), Papritz et al.
patent: 6192801 (2001-02-01), Papritz et al.
patent: 6222648 (2001-04-01), Wolf et al.
patent: 6366358 (2002-04-01), Satou et al.
patent: 6446555 (2002-09-01), Schramm et al.
patent: 6853464 (2005-02-01), Ueda et al.
patent: 2002/0043166 (2002-04-01), Okuda
patent: 2002/0135788 (2002-09-01), Arakawa et al.
patent: 2004/0001210 (2004-01-01), Chu et al.
patent: 0 518 559 (1992-12-01), None
patent: 0 705 784 (1996-04-01), None
patent: 0 836 941 (1998-04-01), None
patent: 1 149 703 (2000-04-01), None
patent: 1 084 843 (2001-03-01), None
patent: 62-130344 (1987-06-01), None
patent: 06-079853 (1994-03-01), None
patent: 07-284090 (1995-10-01), None
patent: 09-186900 (1997-07-01), None
patent: 09-201947 (1997-08-01), None
patent: 2824334 (1998-04-01), None
patent: 11-48456 (1999-02-01), None
patent: 2001-138489 (2001-05-01), None
patent: 2003-103762 (2003-04-01), None
patent: 020003103762 (2003-04-01), None
patent: 2003-311933 (2003-11-01), None
patent: 2003-326678 (2003-11-01), None
patent: 02003311933 (2003-11-01), None
patent: 02003326678 (2003-11-01), None

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